Abstract

This paper proposes a novel approach to combinatorial test generation, which achieves an increase of not only the number of new combinations but also the distance between test cases. We applied our distance-integrated approach to a state-of-the-art greedy algorithm for traditional combinatorial test generation by using two distance metrics, Hamming distance, and a modified chi-square distance. Experimental results using numerous benchmark models show that combinatorial test suites generated by our approach using both distance metrics can improve interaction coverage for higher interaction strengths with low computational overhead.

BibTeX

@inproceedings{ECCATKOMAY-ISSRE2016,
 author    = "Eun-Hye Choi and Cyrille Artho and Takashi Kitamura and
              Osamu Mizuno, and Akihisa Yamada",
 title     = "Distance-Integrated Combinatorial Testing",
 booktitle = "Proceedings of the 27th International Symposium on Software
              Reliability Engineering (ISSRE 2016)",
 pages     = "93 - 104",
 year      = 2016
}